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ME7848A VectorStar™ Opto-Electronic Network Analyzers

ME7848A VectorStar™ Opto-Electronic Network Analyzers

The VectorStar ME7848A opto-electronic network analyzer (ONA) provides a modular approach to optical measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths. There are two configurations available: the VectorStar ME7848A-100 series includes the MN4765B O/E calibration module and the VectorStar ME7848A-200 series adds the MN4775A E/O converter.

The VectorStar ME7848A-200 series provides the ability to quickly switch between O/E, E/O, and O/O measurements with specified traceable measurements established by the MN4765B O/E calibration module.

The VectorStar ME7848A ONA can be easily modified to different wavelengths by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A-100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

ME7848A VectorStar™ Opto-Electronic Network Analyzers

Features

  • Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
  • MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
  • MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
  • National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
  • Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
  • Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
  • Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.