Fourteen Star Engineering

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Transformer Test System / Component Analyzer Model 3250/3252/3302

Transformer Test System / Component Analyzer Model 3250/3252/3302

The 3250/3252/3302 Transformer Test System are the precision test systems, designed for transformer production line or incoming/ outgoing inspection in quality control process, with high stability and high reliability.

The 3250/3252 provide 20Hz-200kHz tes t frequencies, and 3302 provides 20Hz-1MHz test frequencies. In addition to transformer scanning test function, the 3252/3302 have LCR Meter function. In test items, The 3250/3252/3302 cover most of transformer's low-voltage test parameters which include primar y test parameters as Inductance, Leakage Inductance, Turns-Ratio, DC resistance, Impedance, and Capacitance (between windings) etc.; secondary test parameters as Quality Factor and ESR etc.; and pin-short test function. High-speed digital sampling measurement technology combined wi th scanning test fixture (A132501) design, improve low-efficiency transformer inspection to be more accurate and faster.

  • Key Features:
    • Test frequency: 20Hz~200kHz/1MHz, 0.02% accuracy
    • Basic accuracy: 0.1%
    • Different output impedance modes, measurement results are compatible with other well-known LCR meters
    • Enhanced Turn Ratio measurement accuracy for low permeability core
    • Fast Inductance/ Turn Ratio measurement speed up to 80 meas./sec
    • Fast DCR measurement speed up to 50 meas./sec
    • Graphical and tabular display of swept frequency, voltage current and bias current measurements (3252/3302)
    • Build-in 8mA bias for RJ45 transmission transformer saturation condition (option)
    • Leakage inductance 100 bin sorting and balance of leakage inductance for TV inverter transformer
    • ALC (Auto Level Compensation) function for MLCC measurement (3252/3302)
    • Test fixture residual capacitance compensation for transformer inductance measurement
    • 1320 Bias Current Source directly control capability (3252/3302)
    • 320x240 dot-matrix LCD display
    • Support versatile standard and custom-design test jigs
    • Four-terminal test for accurate, stable DCR, inductance and turn ratio measurements
    • Built-in comparator; 10 bin sorting with counter capability (3252/3302)
    • Lk standard value with Lx measure value
    • 4M SRAM memory card, for setup back-up between units
    • Standard RS-232, Handler, and Printer Interface, option GPIB Interface for LCR function only
    • 15 internal instrument setups for store/recall capability